11 H 5744 测试探针-产品快照
- 品牌:
- 11 H 5744
- 型号:
- 11 H 5744
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| 供应商名称 | 电话 | 备注 |
|---|---|---|
| 暂无展示，可咨询在线客服 | 400-811-6961 |
 微信咨询，cs11@gchane.com , QQ1429311537
|
产品介绍
11 H 5744 测试探针
F588.06, probe with plunger tip 06, TD 1.5 mm, CuBe, gold
11 H 5744
Long travel probes with plunger tip for 2.54 mm grid, type Feinmetall F588. Primarily for use on loaded PCBs (SMD as well). Often used in combination with pin F585 for two-stage adaptations. The receptacle with press-ring is the same as used with F585 and allows custom projection heights; Projecting height: 14.1 to 21.7 mm. Contact tolerance: ±0.1 mm. Operating temperatures: –20 to +80 °C. Maximum continuous current: 5.0 A. Typical contact resistance: 25 mohm. Barrel: gold-plated new silver. Spring: spring steel, gold-plated. Receptacle: gold-plated new silver. Tip designs: 05 concave (cup), 06 serrated (honeycomb), 15 triangular head (pyramid), 18 conical shaft (spear) 30°, 21 four-point crown head (self-cleaning), 28 four-point crown head, 33 lance shaft (dagger). Spring force 300 cN ±20 %, type F588. Maximum spring travel: 11.0 mm. Recommended spring travel: 9.6 mm. Prestress: 70 cN. Technical attributes (type, plunger with tip design, tip diameter (TD), material, finish (LG is long-life gold for particularly long endurance)): F588.06, probe with plunger tip 06, TD 1.5 mm, CuBe, gold
There are 29 piece in stock 121 122 214 121 662 5865 2 1 565 2 1
Test probes
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