11 H 5732 测试探针-产品快照
- 品牌:
- 11 H 5732
- 型号:
- 11 H 5732
* 所有产品信息均源于第三方公开数据或用户上传，工业链仅整合供参考，真实价格货期请联系供应商确认.
| 供应商名称 | 电话 | 备注 |
|---|---|---|
| 暂无展示，可咨询在线客服 | 400-811-6961 |
 微信咨询，as10@gchane.com , QQ3350168184
|
产品介绍
11 H 5732 测试探针
F588.06, probe with plunger tip 06, TD 1.5 mm, CuBe, gold
11 H 5732
Long travel probes with plunger tip for 2.54 mm grid, type Feinmetall F588. Primarily for use on loaded PCBs (SMD as well). Often used in combination with pin F585 for two-stage adaptations. The receptacle with press-ring is the same as used with F585 and allows custom projection heights; Projecting height: 14.1 to 21.7 mm. Contact tolerance: ±0.1 mm. Operating temperatures: –20 to +80 °C. Maximum continuous current: 5.0 A. Typical contact resistance: 25 mohm. Barrel: gold-plated new silver. Spring: spring steel, gold-plated. Receptacle: gold-plated new silver. Tip designs: 05 concave (cup), 06 serrated (honeycomb), 15 triangular head (pyramid), 18 conical shaft (spear) 30°, 21 four-point crown head (self-cleaning), 28 four-point crown head, 33 lance shaft (dagger). Spring force 180 cN ±20 %, type F588. Maximum spring travel: 12.0 mm. Recommended spring travel: 9.6 mm. Prestress: 40 cN. Technical attributes (type, plunger with tip design, tip diameter (TD), material, finish (LG is long-life gold for particularly long endurance)): F588.06, probe with plunger tip 06, TD 1.5 mm, CuBe, gold
There are 122 piece in stock 121 214 121 81 662 565 5865 2 1 2 1
Test probes
更多产品:
更多品牌:
