11 H 4554 测试探针-产品快照
- 品牌:
- 11 H 4554
- 型号:
- 11 H 4554
* 所有产品信息均源于第三方公开数据或用户上传,工业链仅整合供参考,真实价格货期请联系供应商确认.
供应商名称 | 电话 | 备注 |
---|---|---|
暂无展示,可咨询在线客服 | 400-811-6961 | 微信咨询,cs11@gchane.com , QQ1429311537 |
产品介绍
11 H 4554 测试探针
Switched spring contact with probe tip FS1, D 2.0 mm, silver-plated CuBe, 2.54 mm grid, 2.0 N, 3024/2G-FS1-2,0 N-Ni/S-2,0C
11 H 4554
Precision switching spring contacts, type PTR 30. Design A: 90° concave, for plug pins, wire-wrap posts and straight or bent terminals. Used preferably only for cleaned PCBs because of the risk of soiling. Design C: universal serrated tip (honeycomb) for straight and bent hook-up wires, wire-wrap posts and connector terminals. Design D: round head, for contacting PCB traces and contact surfaces without leaving marks. Also used for socket contacts in connectors. Design F: flat head, suitable especially for convex and clean connecting parts to prevent surface damage. Test probes with probe tip, type 3024/2G. With rapid-change system; Grid: 2.54 mm. Maximum travel: 5.0 mm. Working travel: 4.0 mm. Switching travel: 2.6 mm. Spring force at working stroke (±20 %): 2.0 N. Spring prestress: 0.5 N. Spring force at switching stroke: 1.5 N. Current load capacity: receptacle-plunger/pin-plunger 3.0/1.0 A. Contact resistance receptacle-plunger/pin-plunger: 20/50 mohm. Barrel: gold-plated brass. Spring: gold-plated spring steel. Technical attributes (type, tip shape, tip diameter, plunger material): 3024/2G-FS1-2,0 N-Ni/S-2,0C, FS1, D 2.0 mm, silver-plated CuBe
There are 2 piece in stock orderable 8
Test probes