11 H 4655 测试探针

11 H 4655 测试探针-产品快照

品牌:
11 H 4655
型号:
11 H 4655

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产品介绍

11 H 4655 测试探针

F58518S105L100, probe with plunger tip 18, TD 1.05 mm, steel, long-life gold

11 H 4655

Standard probes with plunger tip for 2.54 mm grid, type Feinmetall F100/F585. For assembled or bare PCBs, also suitable for SMD applications; Projecting height: 8.4 to 16 mm. Contact tolerance: ±0.08 mm. Operating temperatures: –20 to +80 °C. Maximum continuous current: 5.0 A. Typical contact resistance: 30 mohm. Barrel: gold-plated new silver. Receptacle: gold-plated new silver, typical contact resistance 30 mohm. Tip designs: 05 concave (cup), 06 serrated (honeycomb), 07 hexagonal (fluted star) 90°, 10 flexible needle, 11 round shaft, 12 round shaft, 14 four-point crown head (self-cleaning), 15 triangular head (pyramid), 18 conical shaft (spear) 30°, 20 four-point crown head with faces, 21 four-point crown head, 33 lance shaft (dagger) 38°, 34 rigid needle head 15°, 36 seven-point crown tulip with lead central point, 37 four-point crown head with faces, 38 lance shaft (dagger) 90°, 43 lance shaft (dagger) 90°, 64 miniature serrated head (honeycomb). Spring force 100 cN ±20%, type F585. Maximum travel: 6.4 mm. Rated travel: 4.3 mm. Prestress: 40 cN. Contact resistance: typically 20 mohm. Technical attributes (type, plunger with tip design, tip diameter TD, material, finish (LG is long-life gold for particularly long endurance)): F58518S105L100, probe with plunger tip 18, TD 1.05 mm, steel, long-life gold

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